Yokohama, Japan

Hideya Tanabe


Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 53(Granted Patents)


Company Filing History:


Years Active: 1981

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2 patents (USPTO):Explore Patents

Title: Innovations of Hideya Tanabe: Pioneer in Surface Defect Detection

Introduction: Hideya Tanabe, an accomplished inventor based in Yokohama, Japan, has made significant contributions to the field of surface defect detection for metallic materials. With a total of two patents to his name, Tanabe's work has furthered the advancement of technologies used to ensure the integrity of cylindrical metal pieces in various industrial applications.

Latest Patents: Tanabe's latest patents include a Surface Defect Detecting Apparatus for Use with Rotating Circularly and an Apparatus for Surface Flaw Detection on Electrically Conductive Materials. The first patent details a sophisticated system designed to detect surface defects in rotating cylindrical metal pieces using eddy-current flaw detecting coils. The apparatus features a sensor block that rotates about a horizontal axis, effectively following the deflections of the test piece, and incorporates guide wheels and color marking nozzles to highlight defective areas based on detected flaw depths.

The second patent describes a similar device optimized for scanning electrically conductive materials. It uses a coil holder with multiple eddy-current flaw detecting coils, spaced appropriately to maintain a predetermined gap from the surface of the material. This design enhances the accuracy of defect detection while minimizing interference, making it a valuable tool in quality control and assurance.

Career Highlights: Hideya Tanabe has been affiliated with Nippon Kokan Kabushiki Kaisha, a company known for its focus on engineering and manufacturing. His innovative work has paved the way for new standards in defect detection technology, contributing to the safety and reliability of industrial processes.

Collaborations: Throughout his career, Tanabe has worked closely with esteemed colleagues such as Katsuhiko Shimada and Isamu Komine. Their collaborative efforts have been instrumental in refining and implementing defect detection systems that meet the evolving needs of the manufacturing sector.

Conclusion: Hideya Tanabe's pioneering efforts and innovative patents in surface defect detection have made a lasting impact on the industry. His commitment to advancing technology in the field demonstrates the important role inventors play in enhancing product safety and quality. As he continues to work with leading professionals at Nippon Kokan Kabushiki Kaisha, Tanabe's contributions will undoubtedly shape the future of surface inspection technologies.

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