Chiba, Japan

Hidetoshi Nishikawa

This inventor holds 1 USPTO granted patent. Top assignee: Mitsui Engineering and Shipbuilding Company Limited. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hidetoshi Nishikawa. Retrieved from https://idiyas.com/inventor/hidetoshi-nishikawa-rmjmax7i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 29(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Hidetoshi Nishikawa: Innovator in Structural Inspection Technology

Introduction

Hidetoshi Nishikawa is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of structural inspection technology. His innovative approach has led to the development of a unique method that enhances the safety and reliability of various structures.

Latest Patents

Hidetoshi holds a patent for a "Method and apparatus for impact-type inspection of structures." This invention represents a significant advancement in the way structural integrity is assessed, providing a more efficient and effective means of inspection.

Career Highlights

Nishikawa is currently employed at Mitsui Engineering and Shipbuilding Company Limited. His work at this esteemed company has allowed him to apply his inventive skills in practical settings, contributing to the advancement of engineering and technology.

Collaborations

Throughout his career, Hidetoshi has collaborated with talented individuals such as Kunihiro Mitsuhashi and Chihiro Jyomuta. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Hidetoshi Nishikawa's contributions to structural inspection technology exemplify the impact of innovation in engineering. His work continues to influence the industry and enhance safety standards in structural assessments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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