Hidetaka Nakazawa

Title: Hidetaka Nakazawa: Innovator in IC Testing Methods

Introduction

Hidetaka Nakazawa is a notable inventor based in Gunma, Japan. He has made significant contributions to the field of integrated circuit (IC) testing. His innovative approach has led to the development of a unique IC testing method that enhances the efficiency of testing processes.

Latest Patents

Hidetaka Nakazawa holds a patent for an IC testing method. This method involves placing ICs to be tested on IC carriers arranged in an m-row, n-column array on a test tray. The ICs are connected to sockets in a corresponding manner, allowing for simultaneous measurement. The method includes steps to determine the number of ICs present and to load them onto the test tray accordingly. This innovative approach allows for efficient testing of multiple ICs at once.

Career Highlights

Hidetaka Nakazawa is currently employed at Adv Antest Corporation. His work at the company focuses on improving testing methodologies for integrated circuits. His contributions have been instrumental in advancing the technology used in IC testing.

Collaborations

Hidetaka Nakazawa has collaborated with notable coworkers, including Katuhiko Suzuki and Takeshi Onishi. Their teamwork has fostered an environment of innovation and has led to the successful development of new testing methods.

Conclusion

Hidetaka Nakazawa's contributions to IC testing methods exemplify his dedication to innovation in the field. His patent and work at Adv Antest Corporation highlight his role as a key figure in advancing technology for integrated circuits.