Kanagawa, Japan

Hidetaka Kuroiwa

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hidetaka Kuroiwa. Retrieved from https://idiyas.com/inventor/hidetaka-kuroiwa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Hidetaka Kuroiwa and Magnetic Disk-Drive Preamplifier Innovation.

Introduction

Hidetaka Kuroiwa is an inventor associated with Kanagawa, Japan, and Texas Instruments Corporation. His recorded patent work concerns signal amplification and gain control in magnetic disk-drive systems.

Latest Patents

Kuroiwa is credited with 1 patent, titled “Automatic Gain Control for Magnetic Disk-Drive Preamplifier.” The invention describes a preamplifier system that reads data from a magnetic disk through a magneto-resistive read head. A read amplifier generates a signal corresponding to the data, while a gain control amplifier amplifies that signal according to a digital gain value. A feed-forward automatic gain controller sets the digital gain value based on the read signal’s amplitude.

Career Highlights

Kuroiwa’s patent reflects work on improving gain adjustment in magnetic storage read circuitry. The described approach uses the read signal’s amplitude to control amplification within the preamplifier system.

Collaborations

Hiroyuki Mukai is identified as Kuroiwa’s coworker. The available information does not specify their particular projects or collaboration on the patent.

Conclusion

Hidetaka Kuroiwa’s recorded invention addresses automatic gain control for magnetic disk-drive preamplifiers, linking his patent work with Texas Instruments Corporation and the field of magnetic storage technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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