Ibaraki, Japan

Hideo Tomama

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hideo Tomama. Retrieved from https://idiyas.com/inventor/hideo-tomama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Hideo Tomama: Innovator in Digital Camera Technology

Introduction

Hideo Tomama is a notable inventor based in Ibaraki, Japan. He has made significant contributions to the field of digital imaging technology. His work has been recognized for its innovative approach to enhancing image quality in digital cameras.

Latest Patents

Hideo Tomama holds a patent for a "Digital still camera system and method." This invention focuses on an interpolation technique for a Bayer pattern color-filtered array, incorporating edge enhancement by clamping green interpolation values. This technology aims to improve the overall image quality captured by digital cameras.

Career Highlights

Tomama is currently employed at Texas Instruments Corporation, where he continues to work on advancements in digital imaging technology. His expertise and innovative mindset have positioned him as a valuable asset to the company.

Collaborations

Throughout his career, Hideo Tomama has collaborated with esteemed colleagues such as Osamu Koshiba and Akira Osomato. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Hideo Tomama's contributions to digital camera technology exemplify the impact of innovation in the field of imaging. His patent and ongoing work at Texas Instruments Corporation highlight his commitment to enhancing the quality of digital photography.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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