This inventor holds 1 USPTO granted patent. Top assignee: Okazaki Manufacturing Company. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: Hideo Obi - Innovator in Crack Detection Technology
Introduction
Hideo Obi is a notable inventor based in Kobe, Japan. He has made significant contributions to the field of structural integrity through his innovative designs. His work primarily focuses on developing technologies that enhance safety and reliability in various structures.
Latest Patents
Hideo Obi holds a patent for a crack detection device. This device is designed to detect cracks that may occur in structures. It features an MI cable that includes a metal sheath and a conductive wire, which is housed within the sheath using a mineral insulating powder. The cable is strategically placed along the structure to intersect with an assumed crack. Additionally, the device includes a joint portion made of metal that solidifies from a melting state, connecting the MI cable to the structure. A detection device is also integrated, which monitors the electrical characteristics of the conductive wire.
Career Highlights
Hideo Obi has been associated with Okazaki Manufacturing Company, where he has applied his expertise in developing innovative solutions. His work has been instrumental in advancing technologies that ensure the safety of structures. With a focus on practical applications, he has contributed to the field through his unique inventions.
Collaborations
Hideo Obi has collaborated with notable colleagues, including Kazuhide Okazaki and Masaru Yamana. Their combined efforts have fostered an environment of innovation and creativity within their projects.
Conclusion
Hideo Obi's contributions to crack detection technology exemplify his commitment to enhancing structural safety. His innovative approach and dedication to his work continue to make a significant impact in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile