Tokyo, Japan

Hideo Kizuka

This inventor holds 1 USPTO granted patent. Top assignee: Nippon Sheet Glass Company, Limited. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hideo Kizuka. Retrieved from https://idiyas.com/inventor/hideo-kizuka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: The Innovations of Hideo Kizuka

Introduction

Hideo Kizuka is a notable inventor based in Tokyo, Japan. He is recognized for his contributions to the field of glass manufacturing, particularly in the detection of defects in glass plates.

Latest Patents

Kizuka holds a patent for an "Apparatus for detecting cut-edge flaws in glass plates." This innovation addresses a critical quality control issue in the glass industry, ensuring that products meet high standards of safety and quality.

Career Highlights

Currently affiliated with the Nippon Sheet Glass Company, Limited, Kizuka employs his inventive skills to enhance technological processes within the company. His expertise contributes significantly to the development of more reliable manufacturing techniques in the glass sector.

Collaborations

Throughout his career, Hideo Kizuka has worked alongside notable colleagues, including Igisu Masao and Yoshiomi Toyota. Their collaborative efforts have fostered a creative environment, leading to advancements in glass production technologies.

Conclusion

Hideo Kizuka’s work exemplifies the pivotal role of inventors in improving industrial processes. His patent for detecting flaws in glass plates not only showcases his ingenuity but also highlights the importance of innovation in maintaining product quality in the glass industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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