Owariasahi, Japan

Hidekuni Fukao

This inventor holds 1 USPTO granted patent. Top assignee: Toyota Jidosha Kabushiki Kaisha. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hidekuni Fukao. Retrieved from https://idiyas.com/inventor/hidekuni-fukao-8smt4fv9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hidekuni Fukao and His Patent for an Interactive Display System.

Introduction

Hidekuni Fukao is an inventor associated with Toyota Jidosha Kabushiki Kaisha in Owariasahi, Japan. His recorded patent work concerns a display system and method for comparing sample images before and after image processing. Fukao is credited with 1 patent.

Latest Patents

Fukao’s patent, “Display System and Display Method,” describes a system that acquires image data of a sample and processes that data. The display divides an image area into two regions separated by a boundary line that users can move. One region shows the relevant portion of the original image, while the other shows the corresponding portion after processing. This arrangement enables users to compare the two versions interactively.

Career Highlights

The available information identifies Fukao as an inventor associated with Toyota Jidosha Kabushiki Kaisha. His patent highlights work on an interface for examining image-processing results alongside source images.

Collaborations

The patent record associates Fukao’s invention with Toyota Jidosha Kabushiki Kaisha. The provided information does not identify additional co-inventors or collaborators.

Conclusion

Hidekuni Fukao’s recorded patent presents a movable split-screen approach to comparing original and processed sample images, reflecting his contribution to display technology at Toyota Jidosha Kabushiki Kaisha.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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