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Title: Innovations of Inventor Hideki Muto
Introduction
Hideki Muto is a notable inventor based in Odawara, Japan. He has made significant contributions to the field of sensor technology, holding two patents that showcase his innovative approach to measuring incident light and enhancing image sensors.
Latest Patents
Muto's latest patents include a "Measuring method of incident light and sensor having spectroscopic mechanism employing it." This invention provides a method for measuring incident light using a simple semiconductor structure with a single electron-capturing section. The spectroscopic sensor consists of a semiconductor substrate, a first diffusion layer, a second diffusion layer, and an electrode film that transmits incident light while being applied with a gate voltage. By varying the gate voltage, the sensor can measure the wavelength and intensity of the incident light based on the current indicating the quantity of captured electrons.
Another significant patent is the "Back-illuminated image device having signal charges suppressing region." This back-illuminated image sensor features a converting layer that transforms an incident beam into signal charges, along with charge collecting portions and suppressing regions. The design aims to enhance the efficiency of signal charge collection while minimizing interference from peripheral circuits.
Career Highlights
Throughout his career, Hideki Muto has worked with esteemed organizations such as the Japan Science and Technology Agency and Shimadzu Corporation. His experience in these institutions has allowed him to develop and refine his innovative ideas in sensor technology.
Collaborations
Muto has collaborated with notable colleagues, including Kazuaki Sawada and Makoto Ishida. Their combined expertise has contributed to advancements in the field of imaging and sensor technologies.
Conclusion
Hideki Muto's contributions to sensor technology through his innovative patents demonstrate his commitment to advancing the field. His work continues to influence the development of more efficient and effective measurement systems.