Aichi, Japan

Hidehiko Nakagawa

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Public University Corporation Nagoya City University, Riken Corporation, The University of Tokyo. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hidehiko Nakagawa. Retrieved from https://idiyas.com/inventor/hidehiko-nakagawa-6nj2irk9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Hidehiko Nakagawa

Introduction

Hidehiko Nakagawa is a prominent inventor based in Aichi, Japan. He is known for his contributions to the field of fluorescent probes, particularly in the detection of ENPP activity. His innovative work has led to the development of a novel fluorescent probe that has significant implications in scientific research.

Latest Patents

Hidehiko Nakagawa holds 1 patent for his invention titled "Fluorescent probe for detection of ENPP activity." This patent describes a compound of a specific general formula or a salt thereof, which serves as a valuable tool in detecting ENPP activity.

Career Highlights

Throughout his career, Nakagawa has been associated with prestigious institutions such as The University of Tokyo and Nagoya City University. His work in these institutions has allowed him to advance his research and contribute to the scientific community.

Collaborations

He has collaborated with notable colleagues, including Yasuteru Urano and Toru Komatsu, which has further enriched his research endeavors.

Conclusion

Hidehiko Nakagawa's innovative contributions to the field of fluorescent probes exemplify the impact of dedicated research in advancing scientific knowledge. His work continues to inspire future innovations in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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