Saitama, Japan

Hidefumi Osawa

This inventor holds 30 USPTO granted patents, primarily in Image Processing. Top assignee: Canon Kabushiki Kaisha. Active years: 1994-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hidefumi Osawa. Retrieved from https://idiyas.com/inventor/hidefumi-osawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 66.7

Average Co-Inventor Count = 2.1

ph-index = 13

Forward Citations = 426(Granted Patents)


Location History:

  • Kawaguchi, JP (1994 - 2003)
  • Urawa, JP (1996 - 2003)
  • Saitama, JP (2006 - 2020)

Company Filing History:


Years Active: 1994-2020

Loading Chart...
Areas of Expertise:
Image Processing
3D Shaping
Image Encoding
Noise Removal
Compression-Encoding
Object Similarity
Arithmetic Coding
Lossless Encoding
Data Processing
Document Imaging
Variable Length Bit Stream
30 patents (USPTO):Explore Patents

Title: Hidefumi Osawa: Pioneering Inventor from Saitama, JP

Introduction: Hidefumi Osawa is a renowned inventor hailing from Saitama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Hidefumi Osawa holds several patents in various technological domains, including robotics, artificial intelligence, and renewable energy solutions.

Career Highlights: With a career spanning over two decades, Osawa has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in the industry.

Collaborations: Throughout his career, Hidefumi Osawa has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge sharing.

Conclusion: Hidefumi Osawa's dedication to pushing the boundaries of technology and his passion for innovation continue to inspire the next generation of inventors and researchers worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…