Yokohama, Japan

Hideaki Uehara

This inventor holds 3 USPTO granted patents. Top assignee: Kabushiki Kaisha Toshiba. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hideaki Uehara. Retrieved from https://idiyas.com/inventor/hideaki-uehara-tiddho7a

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.8

ph-index = 1


Company Filing History:


Years Active: 2026

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3 patents (USPTO):Explore Patents

Title: The Innovations of Hideaki Uehara

Introduction

Hideaki Uehara is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of analysis apparatuses and methods. His work is characterized by a focus on improving the efficiency and accuracy of data analysis.

Latest Patents

Uehara holds a patent for an "Analysis apparatus, analysis method, and computer program product." This invention includes one or more hardware processors that acquire pieces of input data representing physical quantities of corresponding elements. The elements are obtained by performing discretization on an analysis area. The hardware processors input the pieces of input data into an estimation model and calculate pieces of output data, each representing a value of an energy functional for the corresponding elements. He has 1 patent to his name.

Career Highlights

Hideaki Uehara is associated with Kabushiki Kaisha Toshiba, a leading technology company. His role at Toshiba has allowed him to work on innovative projects that push the boundaries of technology and analysis.

Collaborations

Uehara has collaborated with notable colleagues, including Akira Kano and Kenji Hirohata. These collaborations have contributed to the advancement of technology in their respective fields.

Conclusion

Hideaki Uehara's contributions to the field of analysis apparatuses and methods highlight his innovative spirit and dedication to technology. His work continues to influence advancements in data analysis and processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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