Kanagawa, Japan

Hideaki Hirahara

This inventor holds 1 USPTO granted patent. Top assignee: Afit Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hideaki Hirahara. Retrieved from https://idiyas.com/inventor/hideaki-hirahara-8vsr0cuk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Innovations of Hideaki Hirahara

Introduction

Hideaki Hirahara is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of imaging technology, particularly in the development of methods for creating electrostatic latent images. His innovative approach has led to the filing of a patent that addresses key challenges in the imaging process.

Latest Patents

Hirahara holds a patent for "Methods and apparatus for developing an electrostatic latent image using conductive particles." This invention focuses on utilizing conductive materials, such as carbon and metal particles with low resistance values, to develop images without the need for insulating membranes. This advancement helps to prevent impurities in the conductive material printed by the imaging system.

Career Highlights

Hirahara is currently associated with Afit Corporation, where he continues to work on innovative imaging solutions. His expertise in the field has positioned him as a valuable asset to the company and the industry at large.

Collaborations

Hirahara has collaborated with notable colleagues, including Takaaki Konuma and Norio Yamagishi. Their combined efforts contribute to the advancement of technology in their respective fields.

Conclusion

Hideaki Hirahara's work exemplifies the spirit of innovation in imaging technology. His patent and contributions to Afit Corporation highlight his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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