Taipei, Taiwan

Hi Feng Wu

This inventor holds 1 USPTO granted patent. Top assignee: Inventec Corp.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hi Feng Wu. Retrieved from https://idiyas.com/inventor/hi-feng-wu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2005

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Hi Feng Wu - Innovator in Workflow Systems

Introduction

Hi Feng Wu is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of electronic workflow systems, enhancing efficiency and reducing management costs for enterprises.

Latest Patents

Hi Feng Wu holds a patent for a "System and method for operating workflow." This innovative system is designed to conduct an electronic workflow for an enterprise based on a server/client architecture in an intranet or internet environment. The system allows users to submit requests for inquiring, browsing, issuing, or reading documents. These requests are transmitted to a network server, which initiates a service server to process the request and return the results to the user. This system serves as a powerful tool to replace conventional manual processing systems, promoting working efficiency and reducing management costs.

Career Highlights

Hi Feng Wu is associated with Inventec Corporation, where he applies his expertise in developing advanced workflow solutions. His work has been instrumental in streamlining processes within the organization.

Collaborations

Hi Feng Wu collaborates with Sheng-Chang Chang, contributing to the development of innovative solutions in their field.

Conclusion

Hi Feng Wu's contributions to workflow systems exemplify the impact of innovation in enhancing enterprise efficiency. His patent reflects a commitment to improving operational processes through technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…