Madison, WI, United States of America

Hewei Liu

This inventor holds 1 USPTO granted patent. Top assignee: Wisconsin Alumni Research Foundation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hewei Liu. Retrieved from https://idiyas.com/inventor/hewei-liu-vxl4tdfz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Hewei Liu: Inventor of a Tunable Fresnel Zone Plate

Introduction

Hewei Liu is an inventor associated with Madison, Wisconsin, and the Wisconsin Alumni Research Foundation. His work includes an invention for adjusting the focal length of a Fresnel zone plate through a mechanically stretchable structure.

Latest Patents

Liu is credited with 1 patent, titled “Fresnel zone plate.” The invention describes a wafer with alternating transparent and opaque zones, with silicon nanowires extending into the opaque zones. A mechanically stretchable tuning structure is mounted on the wafer, and stretching it varies the zone plate’s focal length. The patent description refers to the wafer’s mounting surface.

Career Highlights

The available information identifies Liu’s patent work and his association with the Wisconsin Alumni Research Foundation. The invention combines Fresnel zone plate optics with a mechanical tuning approach.

Collaborations

Liu’s listed coworkers include Yen-Sheng Lu and Hongrui Jiang. Their names are provided as colleagues, though the available information does not specify their roles in this patent.

Conclusion

Hewei Liu’s patent presents a mechanically adjustable Fresnel zone plate designed to vary its focal length, reflecting his documented inventive work associated with the Wisconsin Alumni Research Foundation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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