Company Filing History:
Years Active: 1998-2012
Title: Heui-Jae Park: Innovator in Optical Examination Technologies
Introduction
Heui-Jae Park is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of optical examination technologies, holding a total of 2 patents. His work focuses on enhancing the efficiency and accuracy of examination devices and systems.
Latest Patents
One of Heui-Jae Park's latest inventions is a dark-field examination device. This device is designed to improve the examination process by utilizing an illumination unit that irradiates light towards an examination object. It features a reflection unit that reflects incident light back towards the examination object and an imaging unit that captures images of the examination object by receiving scattered light. The arrangement of these components allows for effective imaging and examination.
Another significant patent is an automatic inspection system for camera lenses. This system employs a line charge coupled device (CCD) to process signals and accurately perceive the focal distance of lenses. It utilizes a modulation transfer function (MTF) method for automatic focusing during lens design. The system comprises various components, including a light source, a chart, a collimator, camera lenses, a mirror, an image pickup part, a signal converter, and a control part.
Career Highlights
Heui-Jae Park has worked with prominent companies such as SNU Precision Co., Ltd. and Samsung Aerospace Industries, Ltd. His experience in these organizations has contributed to his expertise in optical technologies and innovations.
Collaborations
Heui-Jae Park has collaborated with notable individuals in his field, including Tai-Wook Kim and Il-Hwan Lee. These collaborations have likely fostered innovation and advancements in the technologies he has developed.
Conclusion
Heui-Jae Park is a distinguished inventor whose work in optical examination technologies has led to significant advancements. His patents reflect his commitment to improving examination processes and systems.