The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 1998
Filed:
Nov. 15, 1996
Applicant:
Inventors:
Heui-Jae Park, Seoul, KR;
Seok-Won Lee, Seoul, KR;
Geon-Mo Kang, Kyeongsangnam-do, KR;
Ho-Gyun Moon, Kyeongsangnam-do, KR;
Assignee:
Samsung Aerospace Industries, Ltd., Kyeongsangnam-do, KR;
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
3561245 ;
Abstract
An automatic inspection system for camera lenses and method thereof using a line charge coupled device (CCD) which can process a signal easily and perceive a focal distance of lenses exactly by focusing automatically using a modulation transfer function (MTF) method when designing lenses. The automatic inspection system for camera lenses using a line CCD comprises a light source, a chart, a collimator, camera lenses, a mirror, an image pickup part, a signal converter, and a control part.