Hoehenkirchen-Siegertsbrunn, Germany

Hermann Haas

This inventor holds 1 USPTO granted patent. Top assignee: Qimonda Ag. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hermann Haas. Retrieved from https://idiyas.com/inventor/hermann-haas-keqgpr2j

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Hermann Haas - Innovator in Integrated Device Testing

Introduction

Hermann Haas is a notable inventor based in Hoehenkirchen-Siegertsbrunn, Germany. He has made significant contributions to the field of integrated device testing, showcasing his expertise through innovative patents. His work focuses on enhancing the efficiency and reliability of testing integrated circuits.

Latest Patents

Hermann Haas holds a patent for an "Integrated device for simplified parallel testing, test board for testing a plurality of integrated devices, and test system and tester unit." This integrated device comprises a functional circuit, a test circuit for testing the functional circuit, and a register element for storing and outputting error data. The design aims to streamline the testing process, making it more efficient and effective.

Career Highlights

Throughout his career, Hermann has demonstrated a commitment to innovation in the technology sector. His work at Qimonda AG has positioned him as a key player in the development of advanced testing solutions for integrated devices. With a focus on practical applications, he has contributed to the advancement of testing methodologies.

Collaborations

Hermann has collaborated with notable colleagues, including Manfred Proell and Stephan Schroeder. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Hermann Haas is a distinguished inventor whose work in integrated device testing has made a lasting impact on the industry. His innovative patent and collaborative efforts highlight his dedication to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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