Bielefeld, Germany

Hermann Breitinger

This inventor holds 1 USPTO granted patent. Top assignee: Durkoppwerke Gmbh. Active years: 1978.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hermann Breitinger. Retrieved from https://idiyas.com/inventor/hermann-breitinger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1978

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1 patent (USPTO):Explore Patents

Title: Hermann Breitinger: Inventor of a Sewing-Machine Workpiece Guide

Introduction

Hermann Breitinger is an inventor associated with Bielefeld, Germany. His recorded patent concerns a device designed to guide fabric accurately during sewing-machine operations.

Latest Patents

Breitinger’s listed patent is “Workpiece Guide Device for Sewing Machines.” The invention is intended to help sew the edges of two or more fabric pieces together accurately, including trouser parts. It uses a vertically positioned linear guide on the sewing table to align the fabric edges, along with a three-plate assembly mounted on a slide that moves toward and away from the stitching location. Clamping means can hold the fabric pieces between the plates. Breitinger is credited with 1 patent.

Career Highlights

Breitinger is associated with Dürkoppwerke GmbH, a company connected to sewing-machine technology. His patent addresses practical fabric alignment and handling during sewing.

Collaborations

Herbert Diekmann and Harald Collbrunn are identified as Breitinger’s coworkers. The available information does not specify their roles in developing or patenting the workpiece guide.

Conclusion

Hermann Breitinger’s recorded invention focuses on guiding and securing fabric pieces to support accurate sewing, reflecting a practical contribution to sewing-machine technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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