Eindhoven, Netherlands

Hermanis J Wilting

This inventor holds 1 USPTO granted patent. Top assignee: U.S. Philips Corporation. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hermanis J Wilting. Retrieved from https://idiyas.com/inventor/hermanis-j-wilting

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: Hermanis J Wilting: Innovator in Optical Registration Technology

Introduction

Hermanis J Wilting is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of optical registration technology. His work has led to the development of innovative solutions that enhance data storage and retrieval.

Latest Patents

Hermanis J Wilting holds a patent for an "Optical registration medium with dual information layer." This invention is a read-only optical registration medium that successively includes multiple layers of information, allowing for improved data management and access.

Career Highlights

Wilting is associated with U.S. Philips Corporation, a leading company in technology and innovation. His role at Philips has allowed him to work on cutting-edge projects that push the boundaries of optical technology.

Collaborations

Throughout his career, Wilting has collaborated with esteemed colleagues such as Johannes T Thijssen and Johannes C Rijpers. These partnerships have fostered a creative environment that has led to groundbreaking advancements in their field.

Conclusion

Hermanis J Wilting's contributions to optical registration technology exemplify the impact of innovative thinking in the tech industry. His patent and collaborations highlight the importance of teamwork in achieving significant advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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