Tempe, AZ, United States of America

Hering-Der Chiou

This inventor holds 1 USPTO granted patent. Top assignee: Motorola Corporation. Active years: 1996.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1996

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Hering-Der Chiou: Innovator in Semiconductor Fabrication

Introduction

Hering-Der Chiou is a notable inventor based in Tempe, AZ (US). She has made significant contributions to the field of semiconductor technology. Her innovative methods have paved the way for advancements in the fabrication of semiconductor substrates.

Latest Patents

Hering-Der Chiou holds a patent for a method of eliminating dislocations and lowering lattice strain. This patent describes a technique for fabricating semiconductor substrates with resistivity below 0.02 ohm-cm. The method involves doping a silicon melt with phosphorus concentrations above 1.times.10.sup.18. Additionally, the silicon melt is doped with a germanium concentration that is 1.5 to 2.5 times that of the phosphorus concentration. This process results in a stress and dislocation-free crystalline boule. The high concentrations of phosphorus induce stress in the crystal lattice, which is compensated by germanium. This innovative approach retards the diffusion of phosphorus, ensuring the integrity of the substrate.

Career Highlights

Hering-Der Chiou is currently employed at Motorola Corporation, where she continues to work on cutting-edge semiconductor technologies. Her expertise in the field has made her a valuable asset to the company.

Collaborations

Hering-Der Chiou has collaborated with Geoffrey J Crabtree, contributing to advancements in semiconductor fabrication techniques.

Conclusion

Hering-Der Chiou's work in semiconductor technology exemplifies innovation and dedication. Her contributions have significantly impacted the industry, and her patent reflects her expertise in the field.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…