Bergheim, Germany

Herbert Munder

This inventor holds 2 USPTO granted patents. Top assignee: Forschungszentrum Julich Gmbh. Active years: 1997-1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Herbert Munder. Retrieved from https://idiyas.com/inventor/herbert-munder

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 1997-1998

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2 patents (USPTO):Explore Patents

Title: Herbert Munder: Innovator in Optical Components

Introduction

Herbert Munder is a notable inventor based in Bergheim, Germany. He has made significant contributions to the field of optical components, holding a total of 2 patents. His work focuses on innovative technologies that enhance the functionality and efficiency of optical systems.

Latest Patents

Munder's latest patents include a "Layered system with an electrically activatable layer" and an "Optical component comprising layers of porous silicon." These inventions reflect his commitment to advancing optical technology and improving the performance of various applications.

Career Highlights

Herbert Munder is currently employed at Forschungszentrum Jülich GmbH, a prominent research center in Germany. His role at this institution allows him to collaborate with other experts in the field and contribute to groundbreaking research.

Collaborations

Munder has worked alongside talented colleagues such as Michael Gotz Berger and Hans Luth. Their combined expertise fosters a collaborative environment that drives innovation and enhances the quality of their research.

Conclusion

Herbert Munder's contributions to optical components and his innovative patents underscore his importance in the field of technology. His work continues to influence advancements in optical systems and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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