Herbert Lammering

Title: Herbert Lammering: Innovator in Yield Prediction and Statistical Process Control

Introduction

Herbert Lammering is a notable inventor based in Glen Allen, VA (US). He has made significant contributions to the field of semiconductor technology, particularly in yield prediction and statistical process control. With a total of 2 patents, his work has had a substantial impact on the industry.

Latest Patents

Lammering's latest patents include "Yield prediction and statistical process control using predicted defect related yield loss" and "System and method for determining yield impact for semiconductor devices." The first patent outlines a method for determining yield loss for a device by calculating killing probabilities based on historic inspection information. It involves classifying defects according to inspection parameters and applying statistical process control to the predicted yield loss. The second patent focuses on determining yield impact for semiconductor wafers by correlating defects to electrical failures and computing kill rates for the dies. This method helps in assessing yield loss for each inspection process.

Career Highlights

Throughout his career, Lammering has worked with prominent companies such as Infineon Technologies and Siemens Aktiengesellschaft. His experience in these organizations has allowed him to develop innovative solutions that address critical challenges in semiconductor manufacturing.

Collaborations

Lammering has collaborated with notable professionals in the field, including Reinhold Ott and Heinrich Ollendorf. These partnerships have contributed to the advancement of technology in yield prediction and process control.

Conclusion

Herbert Lammering's contributions to the field of semiconductor technology through his patents and collaborations highlight his role as an influential inventor. His work continues to shape the industry and improve processes related to yield prediction and statistical control.