Darmstadt, Germany

Herbert Kitzing

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Hottinger Baldwin Messtechnik Gmbh. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Herbert Kitzing. Retrieved from https://idiyas.com/inventor/herbert-kitzing

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Herbert Kitzing: Measurement Amplifier Innovation

Introduction

Herbert Kitzing is an inventor associated with Darmstadt, Germany. His work includes a patent for a measuring amplifier designed to improve calibration accuracy without interrupting measurement.

Latest Patents

Kitzing’s listed patent, “Measuring Amplifier with Background Adjustment and Method Therefor,” describes a system that amplifies, digitizes, and processes signals from measuring transducers. An additional amplifier arrangement can temporarily take over while the primary arrangement is calibrated and, if needed, adjusted. This approach determines both zero-point and amplification errors while allowing measurement to continue. The patent record provided lists 1 patent.

Career Highlights

Kitzing is associated with Hottinger Baldwin Messtechnik GmbH and Hottinger Brüel & Kjær GmbH. His patented work addresses the practical challenge of maintaining measurement accuracy while avoiding interruptions during calibration.

Collaborations

The supplied information names Marco M. Schaeck and Marco M. Schäck as Kitzing’s coworkers. The available details do not specify their roles in developing the patented amplifier.

Conclusion

Herbert Kitzing’s listed invention combines background calibration with uninterrupted measurement, reflecting a focused contribution to precision measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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