Wellesley, MA, United States of America

Henry A Lyden


Average Co-Inventor Count = 3.3

ph-index = 7

Forward Citations = 263(Granted Patents)


Company Filing History:


Years Active: 2000-2004

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8 patents (USPTO):Explore Patents

Title: Innovations of Henry A. Lyden

Introduction

Henry A. Lyden is a notable inventor based in Wellesley, MA, with a remarkable portfolio of eight patents. His work primarily focuses on advancements in temperature control systems, particularly in the semiconductor industry.

Latest Patents

One of his latest patents is a temperature control system for a workpiece chuck. This system is designed to control the temperature of flat workpieces, such as semiconductor wafers, mounted on a chuck. The chuck is strategically positioned over a base, which is essential for its operation with host machines like wafer probers. The innovative design includes a power and control system that utilizes a switching power supply to manage the temperature effectively. Additionally, a series of filters are incorporated to ensure low-noise operation. Another significant patent involves a workpiece chuck that features a non-constraining attachment mechanism. This design allows for temperature cycle testing of wafers while minimizing mechanical stresses and deformation caused by temperature variations.

Career Highlights

Henry A. Lyden has made significant contributions to the field of semiconductor technology through his inventive solutions. His work at Temptronic Corporation has positioned him as a key player in the development of advanced temperature control systems.

Collaborations

Throughout his career, Henry has collaborated with esteemed colleagues such as Paul A. Getchel and Kenneth M. Cole, Sr. These partnerships have further enhanced the innovative capabilities within his projects.

Conclusion

Henry A. Lyden's contributions to temperature control systems in the semiconductor industry exemplify his innovative spirit and dedication to advancing technology. His patents reflect a commitment to improving the efficiency and effectiveness of semiconductor testing processes.

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