Eden, Netherlands

Henri Joseph Van Egmond

This inventor holds 1 USPTO granted patent. Top assignee: Fico B.v.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Henri Joseph Van Egmond. Retrieved from https://idiyas.com/inventor/henri-joseph-van-egmond-kcube65h

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Henri Joseph Van Egmond: Innovator in Carrier Part Removal Technology

Introduction

Henri Joseph Van Egmond is a notable inventor based in Eden, Netherlands. He has made significant contributions to the field of engineering, particularly in the development of methods and apparatuses for removing carrier parts from carriers.

Latest Patents

Van Egmond holds a patent for a "Method and apparatus for removing a carrier part from a carrier." This innovative method involves arranging a notched line in the carrier prior to performing the separating operation. The invention also includes a carrier part with a housing that contains openings filled with encapsulating material, which is manufactured using this method. Additionally, the patent describes an apparatus designed to perform this method effectively.

Career Highlights

Henri Joseph Van Egmond is associated with Fico B.V., where he applies his expertise in engineering and innovation. His work has led to advancements in the efficiency and effectiveness of carrier part removal processes.

Collaborations

Van Egmond collaborates with Adrianus Wilhelmus Van Dalen, contributing to the development of innovative solutions in their field.

Conclusion

Henri Joseph Van Egmond's contributions to the engineering sector, particularly through his patented method for removing carrier parts, highlight his role as an influential inventor. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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