This inventor holds 2 USPTO granted patents. Top assignee: Infineon Technologies Ag. Active years: 2003-2005.
Company Filing History:
Years Active: 2003-2005
Title: Henning Hartmann: Innovator in Device Testing and Data Control
Introduction
Henning Hartmann is a notable inventor based in Oberhaching, Germany. He has made significant contributions to the field of device testing and data control, holding a total of 2 patents. His work focuses on improving the efficiency and reliability of testing configurations and data drivers.
Latest Patents
Hartmann's latest patents include a "Method for testing a device and a test configuration including a device with a test memory." This innovation allows test results determined during the testing of a device to be stored in a memory within the device itself. Consequently, these results are connected with the device and can be accessed at any time for later evaluations. Another significant patent is the "Method and circuit configuration for controlling a data driver." This invention activates a data driver based on a provided bit sequence, producing a data signal that is driven to a high or low validity level according to the binary value of the bits. The design includes a preparation interval before selected reference clock pulse edges, ensuring optimal performance.
Career Highlights
Henning Hartmann is currently associated with Infineon Technologies AG, a leading company in semiconductor solutions. His role involves developing innovative technologies that enhance device testing and data management.
Collaborations
Throughout his career, Hartmann has collaborated with esteemed colleagues such as Alexander Benedix and Reinhard Düregger. These partnerships have contributed to the advancement of his inventions and the overall success of their projects.
Conclusion
Henning Hartmann's contributions to the fields of device testing and data control exemplify his innovative spirit and technical expertise. His patents reflect a commitment to enhancing technology for better performance and reliability.
