Hefei, China

Heng Luo

This inventor holds 1 USPTO granted patent. Top assignee: Anhui Zhibo Photoelectric Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Heng Luo. Retrieved from https://idiyas.com/inventor/heng-luo-rabqstlt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Heng Luo and Fiber-Optic Pipeline Leak Monitoring

Introduction

Heng Luo is an inventor associated with Hefei, China. His work includes a patent for monitoring pipeline leaks using optical-fiber sensing technology.

Latest Patents

Luo is associated with 1 patent: “Pipeline Leakage Monitoring Method and System Based on Optical Fiber Sensing.” The invention addresses signal-baseline jumps and drift by quickly finding the median through dichotomy. It also adjusts the integration starting point in real time to reduce cumulative effects while retaining the sensor’s low-frequency response.

The method uses dichotomy to locate specific positions in sorted moving-window data, accelerating execution. It also maps original data to leakage parameters, reducing redundant and invalid data to a smaller set of parameters corresponding to segmented vibration data after preprocessing.

Career Highlights

Luo is associated with Anhui Zhibo Photoelectric Technology Co., Ltd. His patent focuses on improving the processing and interpretation of optical-fiber sensor data for pipeline leak monitoring.

Collaborations

The provided information lists Pengfei Li and Jiatong Luo as Luo’s coworkers. It does not specify their roles in the patent or their particular contributions.

Conclusion

Heng Luo’s patent presents a data-processing approach intended to make fiber-optic pipeline leak monitoring faster and more reliable.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…