Veldhoven, Netherlands

Hendrikus J Van Esch

This inventor holds 1 USPTO granted patent. Top assignee: Oce-Nederland B.v.. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hendrikus J Van Esch. Retrieved from https://idiyas.com/inventor/hendrikus-j-van-esch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: Hendrikus J Van Esch: Innovator in Light Detection Technology.

Introduction

Hendrikus J Van Esch is a notable inventor based in Veldhoven, Netherlands. He has made significant contributions to the field of light detection technology. His innovative approach has led to the development of a unique light detector circuit.

Latest Patents

Hendrikus holds 1 patent for his invention titled "Light detector circuit." This patent describes a light detector circuit in which the baseline level of the output signal is stabilized by feeding back a control signal to an element with a voltage variable resistance. This element is connected in series with the light detector across a voltage source. The patent showcases several embodiments, including one that employs a differential amplifier circuit with an integrating feedback circuit to establish a stabilized control voltage.

Career Highlights

Hendrikus is currently associated with Oce-Nederland B.V., where he continues to work on innovative projects. His expertise in electronic circuits and light detection has positioned him as a valuable asset in his field.

Collaborations

Hendrikus collaborates with Bastiaan B Eertink, contributing to advancements in their shared projects.

Conclusion

Hendrikus J Van Esch's work in light detection technology exemplifies innovation and creativity. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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