Liverpool, NY, United States of America

Hemanth Ramachandran

This inventor holds 1 USPTO granted patent. Top assignee: International Controls and Measurements Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hemanth Ramachandran. Retrieved from https://idiyas.com/inventor/hemanth-ramachandran

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hemanth Ramachandran and Electronic Device Testing

Introduction

Hemanth Ramachandran is an inventor based in Liverpool, New York. His work includes a patented approach to testing electronic devices, with a focus on combining different testing functions in a single fixture.

Latest Patents

Ramachandran is associated with 1 patent: “Method and Apparatus for Testing Electronic Devices.” The patent describes integrated test fixtures and systems designed to perform both high-potential (Hi-pot) and functional testing on a unit under test while it remains in the fixture. It also describes universal test fixtures that can use a processor or non-transitory tangible medium to provide instructions for carrying out tests, as well as related testing methods.

Career Highlights

Ramachandran is associated with International Controls and Measurements Corporation. His patent reflects an approach to streamlining electronic-device testing by combining test capabilities within an integrated fixture.

Collaborations

The provided information identifies Anish Donald and Weidong Pan as Ramachandran’s coworkers.

Conclusion

Hemanth Ramachandran’s patent centers on integrated and universal test fixtures that support multiple forms of electronic-device testing, highlighting his contribution to testing methods and equipment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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