Hilden, Germany

Helmut Wiacker


Average Co-Inventor Count = 8.2

ph-index = 2

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 1990-1991

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2 patents (USPTO):Explore Patents

Title: Helmut Wiacker: Innovator in Surface and Radiographic Imaging

Introduction

Helmut Wiacker is a notable inventor based in Hilden, Germany. He has made significant contributions to the fields of surface crack detection and radiographic imaging. With a total of 2 patents, his work has advanced the technology used in various industrial applications.

Latest Patents

Wiacker's latest patents include a process and device for detecting and evaluating surface cracks in workpieces. This innovative method utilizes a video camera to capture images of the workpiece surface, which are then digitized and processed by a computer. The result is a binary image that highlights any cracks present, triggering a sorting report when a preselected threshold is exceeded. The process also includes a dynamic threshold level determined by comparing grey shade distributions, ensuring accurate defect representation. Additionally, he has developed a process and device for producing a radiographic image of a body. This system employs high-energy radiation and a real-time imaging setup to evaluate and display cross-sections of the radiographed body, allowing for the identification of defects.

Career Highlights

Throughout his career, Wiacker has worked with prominent companies such as Isotopen-Technik Dr. Sauerwein GmbH and Ford-Werke AG. His experience in these organizations has contributed to his expertise in imaging technologies and defect detection.

Collaborations

Wiacker has collaborated with notable individuals in his field, including Kurt Sauerwein and Rainer Link. These partnerships have further enriched his work and innovations.

Conclusion

Helmut Wiacker's contributions to surface and radiographic imaging demonstrate his commitment to advancing technology in these critical areas. His patents reflect a deep understanding of the challenges in defect detection and imaging, making him a significant figure in the field.

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