Marzling, Germany

Helmut Bumberger

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Helmut Bumberger. Retrieved from https://idiyas.com/inventor/helmut-bumberger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Helmut Bumberger: Innovator in Wafer Probe Technology

Introduction

Helmut Bumberger is a notable inventor based in Marzling, Germany. He has made significant contributions to the field of semiconductor testing through his innovative designs. His work primarily focuses on enhancing the efficiency and accuracy of wafer probe systems.

Latest Patents

Bumberger holds a patent for a fluidic wafer probe. This patent describes a wafer probe test system that features a conductive needle designed to contact a conductive feature on a wafer's surface. The system includes a fluid probe with a multichannel tube, which creates a fluidic seal between a sensor face on the wafer's surface and the conductive feature. The multichannel tube is equipped with a first and second channel, facilitating fluid flow across the sensor face.

Career Highlights

Helmut Bumberger is currently employed at Texas Instruments Corporation, where he continues to develop advanced technologies in semiconductor testing. His work has been instrumental in improving the reliability of wafer testing processes.

Collaborations

Bumberger collaborates with talented colleagues, including Sebastian Meier and Heinrich Wachinger. Their combined expertise contributes to the innovative projects at Texas Instruments Corporation.

Conclusion

Helmut Bumberger's contributions to wafer probe technology exemplify the impact of innovation in the semiconductor industry. His patent for the fluidic wafer probe showcases his commitment to advancing testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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