Asker, Norway

Heljar Hovland

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Elkem Technology A/s. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Heljar Hovland. Retrieved from https://idiyas.com/inventor/heljar-hovland

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Heljar Hovland: Innovator in Flaw Detection Technology

Introduction

Heljar Hovland is a notable inventor based in Asker, Norway. He has made significant contributions to the field of flaw detection in metallic workpieces. His innovative approach focuses on enhancing the quality control processes in manufacturing, particularly for non-magnetic steel workpieces.

Latest Patents

Hovland holds a patent for a method of flaw detection in billets. This invention relates to a technique for identifying flaws and surface defects in metallic workpieces. The method involves heating the surface of the workpiece using an induction coil and scanning it with an infrared camera. This process allows for the recording of a temperature profile that reveals flaws in the surface, providing a reliable means of quality assurance in manufacturing.

Career Highlights

Throughout his career, Heljar Hovland has worked with various companies, including Elkem Technology AS. His experience in the industry has equipped him with the knowledge and skills necessary to develop innovative solutions for flaw detection.

Collaborations

Hovland has collaborated with professionals such as Jan Nilsen and Yngve Strom. These partnerships have contributed to the advancement of his research and the successful implementation of his patented technology.

Conclusion

Heljar Hovland's contributions to flaw detection technology demonstrate his commitment to innovation in manufacturing processes. His patented method enhances the ability to detect surface defects, ensuring higher quality standards in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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