Boeblingen, Germany

Helga Weiss


Average Co-Inventor Count = 4.6

ph-index = 9

Forward Citations = 198(Granted Patents)


Location History:

  • Boeblinge, DE (1991)
  • Boblingen, DE (1996)
  • Gechingen, DE (2000)
  • Boeblingen, DE (1992 - 2001)

Company Filing History:


Years Active: 1991-2001

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11 patents (USPTO):

Title: Helga Weiss: Innovator in Profilometry Technologies

Introduction

Helga Weiss is a distinguished inventor based in Böblingen, Germany. She has made significant contributions to the field of profilometry, particularly in the development of calibration standards and micromechanical sensors. With a total of 11 patents to her name, her work has advanced the precision of measurements in nanotechnology.

Latest Patents

One of her latest patents is a method of producing a calibration standard for 2-D and 3-D profilometry in the sub-nanometer range. This calibration standard comprises a supporting structure made of single crystal material, featuring at least one pair of different kinds of structures, including a raised line and a trench. These structures have identical widths in the range of about 500 nm, with silicon being the preferred single crystal material. The method involves several steps, including providing polished wafers, forming an oxide layer, bonding the wafers, and selectively etching to create the desired structures. This innovation addresses the challenges of measuring the diameter of ultrafine tips for AFM/STM profilometry.

Another notable invention is a micromechanical sensor for AFM/STM profilometry. This sensor consists of a beam with a point for interaction with a test surface and a fixing block. The point features a conical shank with a countersunk point, providing excellent mechanical rigidity. This design is particularly effective for measuring extremely deep and narrow structures with positive side flank angles.

Career Highlights

Helga Weiss is currently employed at International Business Machines Corporation (IBM), where she continues to innovate in the field of profilometry. Her work has garnered attention for its practical applications in nanotechnology and materials science.

Collaborations

Throughout her career, Helga has collaborated with notable colleagues, including Thomas Bayer and Johann Greschner. These partnerships have contributed to the advancement of her research and the successful development of her inventions.

Conclusion

Helga Weiss is a pioneering inventor whose work in profilometry has significantly impacted the field of nanotechnology. Her innovative patents and collaborations highlight her commitment to advancing measurement technologies.

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