Ingelheim am Rhein, Germany

Heinz-Ulrich Schoeder

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Boehringer Ingelheim Vetmedica Gmbh. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Heinz-Ulrich Schoeder. Retrieved from https://idiyas.com/inventor/heinz-ulrich-schoeder

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Heinz-Ulrich Schoeder: Innovator in Measurement Technology

Introduction

Heinz-Ulrich Schoeder is a notable inventor based in Ingelheim am Rhein, Germany. He has made significant contributions to the field of measurement technology, particularly through his innovative methods and patents. His work has implications for various applications in the industry.

Latest Patents

Heinz-Ulrich Schoeder holds a patent for a "Method for producing a plurality of measurement regions on a chip, and chip having a plurality of measurement regions." This patent outlines a method for creating multiple measurement regions on a chip, enhancing the functionality and efficiency of measurement devices.

Career Highlights

Heinz-Ulrich Schoeder is associated with Boehringer Ingelheim Vetmedica GmbH, where he applies his expertise in measurement technology. His career is marked by a commitment to innovation and the development of advanced measurement solutions.

Collaborations

He has collaborated with notable colleagues such as Axel Niemeyer and Matthias Griessner, contributing to the advancement of measurement technologies through teamwork and shared expertise.

Conclusion

Heinz-Ulrich Schoeder's contributions to measurement technology through his patent and work at Boehringer Ingelheim Vetmedica GmbH highlight his role as an influential inventor in the field. His innovative methods continue to shape the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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