This inventor holds 1 USPTO granted patent. Top assignee: Karl Deutsch Pruf - Und Messgeratebau Gmbh+co. Kg. Active years: 1987.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1987
Title: Innovations in Ultrasonic Measurement by Heinz-Peter Schafer
Introduction
Heinz-Peter Schafer is a notable inventor based in Wuppertal, Germany. He has made significant contributions to the field of ultrasonic measurement technology. His innovative approach has led to the development of a patented method that enhances the accuracy of thickness measurements in various applications.
Latest Patents
Heinz-Peter Schafer holds a patent for a "Method of and apparatus for the ultrasonic measurement of the thickness." This invention utilizes pulse reflection ultrasonics to measure the thickness of test articles. The method involves generating a triggering signal for the ultrasonic transmitter in phase with a measuring oscillation of a high and known frequency. By counting the integral number of measuring oscillation pulses that fit into a time period corresponding to the measurement path length, the method achieves high accuracy while minimizing the disadvantages of analog circuit arrangements. This technology is particularly beneficial for portable battery-operated devices.
Career Highlights
Heinz-Peter Schafer is associated with Karl Deutsch Prüf- und Messgerätebau GmbH & Co. KG, where he has applied his expertise in ultrasonic measurement. His work has been instrumental in advancing measurement technologies that are both efficient and reliable.
Collaborations
He has collaborated with Werner F. Roddeck, contributing to the development of innovative measurement solutions.
Conclusion
Heinz-Peter Schafer's contributions to ultrasonic measurement technology exemplify the impact of innovative thinking in engineering. His patented methods continue to influence the field, ensuring high accuracy in measurements across various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile