Ebersbach, Germany

Heinz Becker

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electronics (Europe) Gmbh. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Heinz Becker. Retrieved from https://idiyas.com/inventor/heinz-becker-o0u9y05k

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Heinz Becker: Innovator in Color CRT Manufacturing

Introduction

Heinz Becker is a notable inventor based in Ebersbach, Germany. He has made significant contributions to the field of electronics, particularly in the manufacturing of color cathode ray tubes (CRTs). His innovative approach has led to advancements that improve production efficiency and reduce waste.

Latest Patents

Heinz Becker holds a patent for a method of manufacturing color CRTs. This invention focuses on reducing the reject rate during production by increasing the viscosity of the cleaning bath. This improvement not only enhances the quality of the final product but also streamlines the manufacturing process.

Career Highlights

Becker is associated with Matsushita Electronics (Europe) GmbH, where he has applied his expertise in electronics and manufacturing. His work has been instrumental in advancing the technology behind CRTs, which were once a staple in television and monitor displays.

Collaborations

Heinz Becker has collaborated with Rolf Reidinger, a fellow innovator in the field. Together, they have worked on projects that aim to enhance the efficiency and effectiveness of electronic manufacturing processes.

Conclusion

Heinz Becker's contributions to the field of color CRT manufacturing exemplify the impact of innovation in technology. His patent and work at Matsushita Electronics highlight the importance of continuous improvement in manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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