This inventor holds 2 USPTO granted patents, plus 1 CIPO patent. Top assignee: Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v.. Active years: 1990-1991.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990-1991
Title: Heinrich Hofler: Innovator in Laser Interferometry
Introduction
Heinrich Hofler is a notable inventor based in Teningen, Germany. He has made significant contributions to the field of laser interferometry, particularly in the area of length measurements. With a total of 2 patents to his name, Hofler's work has advanced the capabilities of optical measurement technologies.
Latest Patents
Hofler's latest patents include a laser interferometer designed for interferometric length measurements. One of his innovative inventions is a topographical camera that operates by applying a grid-generated Moire image. This camera is specifically designed for recording the topography of a specimen surface by generating a Moire image with the aid of an object grid applied to the object. It features a CCD sensor with a reference grid that is applied as a physical grid structure directly on the light incidence surface of the CCD sensor.
Career Highlights
Heinrich Hofler is associated with the Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., a leading research organization in Germany. His work at this institution has allowed him to collaborate with other experts in the field and contribute to various innovative projects.
Collaborations
Hofler has worked alongside notable colleagues such as Christa Berger and Otmar Fichter. Their combined expertise has fostered advancements in their respective fields and has led to the successful development of new technologies.
Conclusion
Heinrich Hofler's contributions to laser interferometry and optical measurement technologies highlight his role as an influential inventor. His innovative patents and collaborations continue to shape the future of measurement science.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
