Brussels, Belgium

Heidi Ottevaere

This inventor holds 6 USPTO granted patents and 2 published patent applications and 1 EPO patent. Top assignees: Hamamatsu-Photonics K.k., Vrije Universiteit Brussel. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Heidi Ottevaere. Retrieved from https://idiyas.com/inventor/heidi-ottevaere-vwuy4bj5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 6 

% Patents Active = 83.3

 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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6 patents (USPTO):Explore Patents

Title: The Innovative Journey of Heidi Ottevaere

Introduction

Heidi Ottevaere is a prominent inventor based in Brussels, Belgium. She has made significant contributions to the field of light detection technology, holding a total of 6 patents. Her work has been instrumental in advancing the capabilities of optical devices.

Latest Patents

One of her latest patents includes a lens specifically designed for light detection elements. This innovation showcases her expertise in creating efficient optical components that enhance the performance of various technologies.

Career Highlights

Throughout her career, Heidi has worked with notable organizations such as Hamamatsu Photonics K.K. and Vrije Universiteit Brussel. Her experience in these institutions has allowed her to develop cutting-edge technologies and contribute to significant research projects.

Collaborations

Heidi has collaborated with esteemed colleagues, including Tomohiko Suzuki and Suguru Matsumoto. These partnerships have further enriched her work and expanded the impact of her inventions.

Conclusion

Heidi Ottevaere's contributions to the field of light detection technology exemplify her innovative spirit and dedication to advancing optical science. Her patents and collaborations reflect her commitment to excellence in her field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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