This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Purdue Research Foundation. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: Hehai Jiang: Innovator in Confocal Microscopy
Introduction
Hehai Jiang is a notable inventor based in West Lafayette, IN (US). He has made significant contributions to the field of microscopy, particularly through his innovative work on confocal microscopy systems. His expertise and dedication to research have led to the development of advanced technologies that enhance imaging capabilities.
Latest Patents
Hehai Jiang holds a patent for "Systems and methods for confocal microscopy." This patent describes a confocal microscope system that includes a light source designed to form a light beam, a scanning unit, and an objective lens. The scanning unit is a mechanically driven component with a controllable scanning trajectory, which directs the light beam through this trajectory. The objective lens defines both a pupil plane and a focal plane, allowing for precise imaging. This confocal microscope system is specifically configured for multi-color line-scanning confocal microscopy, enabling multi-color fluorescence imaging without laser excitation crosstalk. He has 1 patent to his name.
Career Highlights
Hehai Jiang is affiliated with the Purdue Research Foundation, where he continues to advance his research in microscopy. His work has been instrumental in pushing the boundaries of imaging technology, making significant strides in the field.
Collaborations
Hehai Jiang collaborates with Meng Cui, a fellow researcher, to further enhance the capabilities of their innovations in microscopy.
Conclusion
Hehai Jiang's contributions to confocal microscopy exemplify the impact of innovative thinking in scientific research. His work not only advances technology but also opens new avenues for exploration in imaging techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
