Suwon, South Korea

Heewon Chae

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Heewon Chae. Retrieved from https://idiyas.com/inventor/heewon-chae

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Heewon Chae and Robot Mapping Technology.

Introduction

Heewon Chae is an inventor based in Suwon, South Korea, and is associated with Samsung Electronics Ltd. Her listed patent concerns robot navigation and map-based localization.

Latest Patents

Chae is credited with 1 patent: “Robot and Robot Control Method.” The invention describes a robot equipped with a LiDAR sensor, a driving module, memory storing map data, and a processor. The robot gathers sensor data as it moves, builds a second map, and compares that map with a stored map using probability information and the positions of detected objects. When the maps are determined to represent the same space, the robot uses the object positions to identify its starting position on the stored map.

Career Highlights

The available information identifies Chae’s work at Samsung Electronics Ltd. and highlights her contribution to robot control and localization technology. The patent’s approach supports a robot in determining its position even when its starting location has not yet been identified on the stored map.

Collaborations

Hankyeol Kim and Seungbeom Han are listed as Chae’s coworkers. The provided information does not specify their roles in the patent or describe particular collaborative projects.

Conclusion

Heewon Chae’s listed patent focuses on helping robots match sensor-generated maps with stored maps and establish their location, reflecting an application of mapping and localization in robotics.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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