Austin, TX, United States of America

Heekwon Chon

This inventor holds 10 USPTO granted patents and 1 published patent application. Top assignee: Dell Products Inc.. Active years: 2014-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Heekwon Chon. Retrieved from https://idiyas.com/inventor/heekwon-chon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 10 

% Patents Active = 90.0

Average Co-Inventor Count = 2.8

ph-index = 6

Forward Citations = 227(Granted Patents)


Company Filing History:


Years Active: 2014-2026

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10 patents (USPTO):Explore Patents

Title: Heekwon Chon: Innovator in Touch Detection Technology

Introduction

Heekwon Chon is a prominent inventor based in Austin, Texas. He has made significant contributions to the field of technology, particularly in the area of touch detection systems. With a total of nine patents to his name, Chon has established himself as a key figure in innovation.

Latest Patents

One of Heekwon Chon's latest patents is an information handling system that focuses on touch detection surface control icon user interfaces for laptop computers. This invention showcases his commitment to enhancing user experience through advanced technology.

Career Highlights

Chon is currently employed at Dell Products Inc., where he continues to develop innovative solutions. His work at Dell has allowed him to be at the forefront of technological advancements in the computing industry.

Collaborations

Heekwon Chon has collaborated with notable colleagues, including Michael Ellis Smith and Frank M Tyneski. These partnerships have contributed to the success of various projects and innovations.

Conclusion

Heekwon Chon is a distinguished inventor whose work in touch detection technology has made a lasting impact. His contributions to Dell Products Inc. and the broader tech community highlight his role as a leader in innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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