Yongin-si, South Korea

Hee Woong Park

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hee Woong Park. Retrieved from https://idiyas.com/inventor/hee-woong-park-pk7gtt5a

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hee Woong Park and Touch-Sensing Display Technology.

Introduction

Hee Woong Park is an inventor associated with Yongin-si, South Korea, and Samsung Display Co., Ltd. The supplied information credits Park with 1 patent concerning display technology and touch sensing.

Latest Patents

Park’s listed patent is “Display Device, Method of Operating the Same, and Electronic Device.” It describes a display panel with pixels and an overlaid sensor array whose electrodes detect touch input. A temperature sensor measures the sensor array’s temperature, allowing the sensor driver to compare a reading taken when no touch is present with a temperature-dependent reference value. If the reading is determined to contain an error, the driver uses the reference value and a reading taken during touch to detect the input.

Career Highlights

The available information connects Park’s patent work with Samsung Display Co., Ltd. The invention addresses how temperature-related sensing errors can be accounted for in touch-enabled display devices.

Collaborations

Han Su Cho and Jun Young Ko are identified as Park’s coworkers. The supplied information does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Hee Woong Park’s listed invention focuses on improving touch detection by accounting for temperature-related errors in display sensor readings.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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