This inventor holds 2 USPTO granted patents and 3 published patent applications. Top assignee: Mirae Corporation. Active years: 2011.
Company Filing History:
Years Active: 2011
Title: Hee Rak Beom: Innovator in Test Handling Technology
Introduction
Hee Rak Beom is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of test handling technology, particularly in the semiconductor industry. With a total of 2 patents, his work focuses on improving the efficiency and effectiveness of handling packaged chips during testing processes.
Latest Patents
Hee Rak Beom's latest patents include innovative designs that enhance the functionality of test handlers. The first patent is for a carrier module for use in a handler, which is designed to handle packaged chips during testing. This carrier module features a body, a base plate for placing the packaged chips, and at least one latch to secure the chips in position. The second patent involves a comprehensive test handler system that includes a loading unit, chamber system, unloading unit, rotating unit, and transferring unit. This system is designed to streamline the loading and unloading processes of packaged chips, ensuring efficient testing and manufacturing.
Career Highlights
Hee Rak Beom is currently employed at Mirae Corporation, where he continues to develop innovative solutions in the semiconductor testing field. His work has been instrumental in advancing the technology used in handling packaged chips, contributing to the overall efficiency of testing processes.
Collaborations
Hee Rak Beom collaborates with talented coworkers, including Jung Ug An and Dae Gon Yun. Their combined expertise fosters a creative environment that drives innovation within their projects.
Conclusion
Hee Rak Beom's contributions to test handling technology exemplify the impact of innovation in the semiconductor industry. His patents reflect a commitment to enhancing the efficiency of testing processes, making him a valuable asset to Mirae Corporation and the field at large.
