Location History:
- Gyeonggi-do, KR (2007 - 2009)
- Suwon-Si, KR (2007 - 2011)
Company Filing History:
Years Active: 2007-2011
Title: Hee-joo Choi: Innovator in Memory Technology
Introduction
Hee-joo Choi is a prominent inventor based in Suwon-si, South Korea. He is known for his significant contributions to memory technology, particularly in the development of advanced testing systems and memory modules. With a total of 6 patents to his name, Choi has made a notable impact in the field.
Latest Patents
One of Choi's latest patents is a test system for conducting parallel bit tests. This innovative system allows for the testing of multiple memory modules mounted on a socket simultaneously. It includes a series of counters that count data output signals in the same logic state and a comparator that identifies defects in the memory modules. This technology enhances the accuracy of defect detection and reduces the likelihood of errors during testing.
Another significant patent involves a memory module and memory system that features a bendable design. This memory module consists of two circuit boards, each with memory chips, connected by a flexible coupler. This design allows the module to bend around a memory controller, ensuring that the signal lines maintain equal lengths. This innovation improves the overall efficiency and functionality of memory systems.
Career Highlights
Hee-joo Choi is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. His work at Samsung has allowed him to collaborate with other talented professionals in the field, further advancing memory technology.
Collaborations
Choi has worked alongside notable colleagues, including Joon-hee Lee and Youn-Cheul Kim. These collaborations have contributed to the development of cutting-edge technologies in memory systems.
Conclusion
Hee-joo Choi's contributions to memory technology through his innovative patents and collaborations highlight his role as a key inventor in the industry. His work continues to influence advancements in memory systems and testing methodologies.