Icheon, South Korea

Hee Eun Choi

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Skhynix Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hee Eun Choi. Retrieved from https://idiyas.com/inventor/hee-eun-choi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Hee Eun Choi: Innovator in Semiconductor Technology

Introduction

Hee Eun Choi is a notable inventor based in Icheon-si, South Korea. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent.

Latest Patents

Hee Eun Choi holds a patent for an "Error check scrub operation method and semiconductor system using the same." This semiconductor system includes a controller that counts the number of error check scrub (ECS) operations. It generates ECS information that details the address where the ECS operation is to be performed based on the number of ECS operations. Additionally, the system features a memory apparatus that executes the ECS operation on a region selected by the ECS information.

Career Highlights

Hee Eun Choi is currently employed at SK Hynix Inc., a leading company in the semiconductor industry. His work focuses on enhancing the reliability and efficiency of semiconductor systems through innovative methods.

Collaborations

Hee Eun Choi collaborates with talented colleagues, including Kwang Soon Kim and Ji Eun Kim, who contribute to the advancement of semiconductor technologies.

Conclusion

Hee Eun Choi's contributions to semiconductor technology through his patent demonstrate his innovative spirit and commitment to advancing the field. His work at SK Hynix Inc. continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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