Shiga, Japan

Haruyuki Nakano


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Haruyuki Nakano: Innovator in Image Recognition Technology

Introduction

Haruyuki Nakano is a prominent inventor based in Shiga, Japan. He has made significant contributions to the field of image recognition technology, particularly in the context of semiconductor manufacturing. His innovative approach has led to the development of a patented method that enhances the efficiency of image recognition processes.

Latest Patents

Haruyuki Nakano holds a patent titled "Method for recognizing images of fine work pieces and pickup apparatus employing the method." This patent focuses on optimizing the image recognition process for semiconductor pellets. By determining the scan area based on the results of the first wafer's image recognition, Nakano's method reduces unnecessary scanning areas in subsequent wafers. This innovation not only saves time but also minimizes costs associated with the inspection process.

Career Highlights

Nakano is associated with NEC Machinery Corporation, where he applies his expertise in image recognition technology. His work has been instrumental in advancing the capabilities of semiconductor inspection processes. With a focus on efficiency and accuracy, Nakano continues to contribute to the field through his innovative solutions.

Collaborations

Haruyuki Nakano collaborates with Wen Jye Chang, a fellow professional in the industry. Together, they work on projects that aim to enhance the performance of image recognition systems in various applications.

Conclusion

Haruyuki Nakano's contributions to image recognition technology exemplify the impact of innovation in the semiconductor industry. His patented methods not only improve efficiency but also pave the way for future advancements in the field.

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