Hakusan, Japan

Harutaka Takebe

This inventor holds 1 USPTO granted patent. Top assignee: Eizo Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Harutaka Takebe. Retrieved from https://idiyas.com/inventor/harutaka-takebe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Harutaka Takebe: Image Processing Innovation

Introduction

Harutaka Takebe is an inventor associated with Hakusan, Japan, and EIZO GmbH. His patent work addresses image processing and the correction of flicker caused by pixel response delays.

Latest Patents

Takebe is credited with 1 patent: “Image Processing Device, Image Processing Method, and Computer Program.” The invention describes a device that corrects a second frame using information from both a first and a second frame. It estimates a flicker component from pixel values in a predetermined region, including an attention pixel and surrounding pixels, and uses that estimate to correct pixel values. The method is designed to address flicker that can occur when an image display transitions between frames because of pixel response delays.

Career Highlights

Takebe’s listed patent reflects work on improving display-image quality through frame-based processing. His affiliation with EIZO GmbH connects his inventive work with a company focused on display technology.

Collaborations

Hiroki Matsuzaki and Takumi Inoue are identified as Takebe’s coworkers. The available information does not specify their roles in the patent or whether they collaborated directly on the invention.

Conclusion

Harutaka Takebe’s patent focuses on estimating and correcting display flicker during frame transitions, highlighting a practical approach to image-processing innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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