Tokyo, Japan

Haruo Nakata

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Electric Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haruo Nakata. Retrieved from https://idiyas.com/inventor/haruo-nakata-tqscc2dy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Haruo Nakata: Innovator in Driving Monitoring Technology

Introduction

Haruo Nakata is a prominent inventor based in Tokyo, Japan. He is known for his contributions to the field of driving monitoring technology. His innovative work has led to the development of a unique device that enhances vehicle safety.

Latest Patents

Nakata holds a patent for a driving monitoring device and computer-readable medium. This device determines an applicable collision pattern based on the velocity vectors of both the vehicle and a mobile object. It calculates the time until collision and assesses the danger level of potential accidents. This technology aims to improve safety measures in vehicles by providing timely warnings to drivers.

Career Highlights

Haruo Nakata is associated with Mitsubishi Electric Corporation, where he has made significant strides in automotive safety technology. His work has been instrumental in advancing the capabilities of driving monitoring systems.

Collaborations

Nakata has collaborated with notable colleagues, including Masahiko Tanimoto and Yosuke Ishiwatari. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Haruo Nakata's innovative contributions to driving monitoring technology exemplify the importance of safety in automotive design. His patent reflects a commitment to enhancing vehicle safety and reducing accidents on the road.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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