Kanazawa, Japan

Haruo Maeda

This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Corporation. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haruo Maeda. Retrieved from https://idiyas.com/inventor/haruo-maeda-0czvzfel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 2003

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Haruo Maeda: Inventor in Synchronous Network Clock Management

Introduction

Haruo Maeda is an inventor associated with Kanazawa, Japan, and Fujitsu Corporation. His patent work addresses clock management in synchronous network systems, where reliable timing is essential for maintaining communication.

Latest Patents

The provided information lists one patent for Maeda: “Clock Management Method and Transmission Apparatus for Synchronous Network System.” The invention describes a system that automatically switches to another clock signal when the quality of the current signal deteriorates, helping synchronous communication continue. It selects a master clock from multiple signals using quality information, converts that information into quality levels, and raises an alarm if the master clock’s quality falls below a defined threshold. Maeda is credited with 1 patent.

Career Highlights

Maeda’s listed invention reflects work on synchronization and clock-quality monitoring for network transmission equipment. The provided information associates him with Fujitsu Corporation.

Collaborations

Masaru Tanaka is identified as Maeda’s coworker. The available information does not specify whether Tanaka collaborated on the patent.

Conclusion

Haruo Maeda’s listed patent focuses on maintaining synchronous network communication through automatic clock selection and quality monitoring.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…